In situ temperature-dependent resistance (R–T)measurement was applied to investigate the amorphous-to-crystalline transition by using a TP 94temperature controller (Linkam Scientific Instruments, Tadworth, Surrey, UK) under Ar atmosphere.

The molecular metal nanoparticles including few-atom metalnanoclusters (NCs) and few-nanometer nanoparticles (NPs)with molecule-like properties are promising luminescent probesfor recognition of chemical species and bioimaging because oftheir unique optical properties and good biocompatibility.

The amorphous-to-crystalline transition was investigated by in situ temperature-dependent resistance (R–T) measurementsusing a TP 95 temperature controller (Linkam ScienticInstruments Ltd. Surry, UK) under an Ar atmosphere.

This instrument was calibrated with fluorescein (QY, 88%) before the measurements. Atomic force microscope (AFM) was carried out on a S-2 FSM-Nanoview 1000 (FSM-Precision, Suzhou) in tapping mode equipped with MikroMasch NSC11 AFM tip

In situ temperature-dependent resistance (R–T) wasperformed using a two-point-probe setup to obtain thecrystallization temperature by a TP 95 temperature controller (Linkam Scientific Instruments Ltd. Surry, UK). Thesamples were...

The dependence of the resistance on the temperature (ReT) of the multilayer ZS/SO and monolayer ZnSb materials were measuredin situ in a homemade vacuum chamber with a TP 94 temperaturecontroller (Linkam Scientific Instruments Ltd, Surrey, UK). The dataretention ability of the amorphous state was estimated. Diffusereflectance spectra were recorded by a near infrared spectroscopy(NIR, 7100CRT, XINMAO, China) spectrophotometer in the wavelength range of 400e2500 nm. The crystalline phase structure wasanalyzed by X-ray diffraction (XRD, PANalytical, X'PERT Powder)with Cu Ka radiation in the 2q range from

The resistance as a function of temperature (R–T) was measured using the in situ measurement with a heating rate of 10 °C min−1. The sample temperature was measured by a Pt-100 thermocouple located at a heating stage controlled by a TP 94 temperature controller...

All films in this paper were prepared by magnetron sputtering.The cylindrical Mg35Sb65 target was placed in the A position whileSb target was placed in B target in vacuum chamber. The sputtering power of A, B target was fixed at 30W. The uniform film wasformed by sputtering deposition on the surface of SiO2 substrates inargon atmosphere of 0.4 Pa. The thickness of films was controlled bychanging the sputtering time.13,14 The composite films ...

The resistance as a function of temperature (R ∼ T)was measured in situwith a ramp rate of 5 °C min−1 invacuum chamber by a Pt-100 thermocouple located at a heating stage controlled by a TP 94 temperaturecontroller(Linkam Scientific Instruments Ltd, Surrey, UK). The 10-year data retention was estimated byrecording the isothermal...

The R–T curves of the phase change flms were measured using an in situ resistance–temperature test system to study the phase transition characteristics of the flms from amorphous to crystalline state. At the same time, the crystallization activation energy (Ea) of the flm was calculated wit...